# generated by Fast Light User Interface Designer (fluid) version 1.0100
RSim -Reflectivity of a multilayer system- (c) 1999 -2001  Markus Leitz
&File
&Save Data 
&Load Data
&Quit
&Mode
R versus angle
R versus wavelength
&Options
&Wavelength
UV (248nm)
Argon-Ion (514 nm)
HeliumNeon (632.8 nm)
Semiconductor (870nm)
Nd:YAG (1300nm)
custom
&Angle of incidence
&Dispersion
&Fit/Modelling
&Help
Note/Readme
Dispersion
Birefringence
&About
d0:
n0:
k0:
d1:
n1:
k1:
d2:
n2:
k2:
d3:
n3:
k3:
d4:
n4:
k4:
d5:
n5
k5:
d6:
n6:
k6:
d7:
n7:
k7:
polarization
TE
TM
min:
max:
resolution:
CALC !
on
off
off
off
off
off
l =
nm
 
 
 
 
 
 
 
Angle  
please 
OK
Dispersion  
on
off
medium  0: 
BK 7
Air
Silver
Teflon AF1600
water
on
off
medium 1: 
Silver
Teflon AF1600
Air
BK 7
Water
on
off
medium 2: 
Silver
Teflon AF1600
Air
BK 7 
Water
on
off
medium 7:  
Air
BK 7 
Silver
Teflon AF1600
Water
&Note
OK
Dispersion
Update
Fit/Modelling
&File
&Import Data
d1
n1
k1
d2
n2
k2
d3
n3
k3
OK
Start
Stop
h
C
About RSim
close
Author
License
Thanks
RSim
